Texas Instruments LMG3526R030RQSR

Overview

LMG3526R030 from Texas Instruments is a 650V, 30mΩ GaN FET with integrated gate driver, cycle-by-cycle overcurrent protection (<100 ns response), zero-voltage detection (ZVD), and digital temperature PWM reporting. It operates from 7.5V–18V supply, supports up to 2 MHz switching, and delivers 20–150 V/ns slew rate control for EMI-optimized hard- and soft-switching in high-density power converters.

For engineers reviewing the LMG3526R030 datasheet, LMG3526R030 pinout, LMG3526R030 application, or LMG3526R030 equivalent, this device is selected for high-efficiency, high-frequency DC/DC and AC/DC designs where fast transient fault response, thermal monitoring, and ZVS-enabling timing signals are required - especially in telecom rectifiers, server PSUs, and solar inverters.

Technical Context

The LMG3526R030 integrates a silicon-based gate driver with precision bias generation, enabling robust 650V GaN switching with 200 V/ns hold-off capability. Its ZVD output provides a pulse-synchronized signal indicating successful zero-voltage switching, with <30 ns delay from IN rise to ZVD pulse edge and 75–140 ns pulse width.

Protection architecture includes latched short-circuit detection (75–105 A threshold), overtemperature shutdown (175°C GaN junction), and UVLO on both VDD (6.4–7.6 V) and VNEG (–13.3 to –12.1 V). Thermal management uses a 9 kHz PWM output encoding junction temperature from 0.3% duty cycle at 25°C to 82% at 150°C.

Key Specifications

Pinout & Package

Package: 52-pin VQFN (RQS), 12.00 mm × 12.00 mm, top-side cooled with exposed thermal pad internally connected to SOURCE and NC2 pins.

Key Features

Applications

Equivalent & Alternatives

The following parts are listed as comparable options for similar high-voltage GaN FET applications.

Compared with LMG3522R030 and LMG3527R030, the LMG3526R030 uniquely provides ZVD output for real-time ZVS validation - enabling tighter dead-time control and higher efficiency in LLC and resonant converters where voltage-based soft-switching is dominant.

Availability

LMG3526R030 is available at Aetrix Electronics and suitable for merchant telecom rectifiers, server PSUs, and solar inverters requiring stable component supply, long-term lifecycle support, and traceable GaN sourcing.

Supply support for LMG3526R030 includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.

Manufacturer

Texas Instruments is a global semiconductor company specializing in analog, embedded processing, and power management technologies with over 50 years of power device innovation.

The LMG352xR030 family was designed specifically for high-frequency, high-density switch-mode power conversion - targeting next-generation data center, renewable energy, and industrial motor control systems demanding integrated protection and intelligent thermal feedback.

FAQ

What is the maximum operating frequency of the LMG3526R030?

The LMG3526R030 supports up to 2 MHz switching frequency in soft-switched conditions. Maximum frequency is derated below 9 V VDD supply. Hard-switching operation is validated at lower frequencies depending on layout parasitics and thermal management - typical design targets range from 300 kHz to 1 MHz for high-power applications. The LMG3526R030's 20–150 V/ns slew rate control allows optimization for either speed or EMI at any given frequency.

How does the ZVD pin function in the LMG3526R030?

The ZVD pin on the LMG3526R030 outputs a push-pull pulse (75–140 ns wide) when zero-voltage switching is detected during the turn-on transition. This occurs after a minimum third-quadrant conduction time (42–56 ns), with 15–30 ns delay from the IN rising edge. The LMG3526R030 uses this hardware-level signal to enable adaptive dead-time control without external sensing - a feature exclusive to the LMG3526R030 within the LMG352xR030 family.

What thermal information does the TEMP pin provide for the LMG3526R030?

The TEMP pin on the LMG3526R030 delivers a fixed 9 kHz PWM signal whose duty cycle encodes the GaN FET junction temperature: 0.3–6% at 25°C, 36–44% at 85°C, 59–70% at 125°C, and 82% at 150°C. This allows direct microcontroller ADC sampling without external thermistors or signal conditioning. The LMG3526R030's thermal reporting is calibrated across –40°C to 150°C and referenced to the GaN die - not the case or PCB.

What protection features are integrated into the LMG3526R030?

The LMG3526R030 integrates cycle-by-cycle overcurrent protection (60–80 A threshold), latched short-circuit protection (75–105 A), GaN junction overtemperature shutdown (175°C), VDD UVLO (6.4–7.6 V), and VNEG UVLO (–13.3 to –12.1 V). All faults assert the FAULT pin low within <100 ns. Unlike discrete solutions, these protections operate autonomously without MCU intervention - a core safety feature of the LMG3526R030.

Can the LMG3526R030 be used in place of the LMG3527R030?

No - the LMG3526R030 and LMG3527R030 are not interchangeable. The LMG3526R030 provides ZVD output for zero-voltage detection, while the LMG3527R030 provides ZCD output for zero-current detection. Their pin 48 functions differ fundamentally: ZVD responds to V_DS ≈ 0 V, ZCD responds to I_D > 0 A. Substituting the LMG3526R030 for LMG3527R030 would disable ZCS timing in topologies relying on current zero-crossing, and vice versa. Both share identical pinout and package but differ in internal detection logic.