Texas Instruments TPD3S716QDBQRQ1

Overview

TPD3S716QDBQRQ1 from Texas Instruments is an AEC-Q100 Grade 1 automotive USB 2.0 interface protection IC with integrated VBUS load switch (63 mΩ typical R_ON), high-speed data switches (1-GHz bandwidth), ±8-kV/±15-kV IEC 61000-4-2 ESD protection on VBUS_CON/VD+/VD–, short-to-battery tolerance up to 18 V on all protected pins, and adjustable hiccup current limit up to 2.4 A. It enables robust USB connectivity in head units and telematics modules.

For engineers reviewing the TPD3S716QDBQRQ1 datasheet, TPD3S716QDBQRQ1 pinout, TPD3S716QDBQRQ1 application, or TPD3S716QDBQRQ1 equivalent, this page delivers verified electrical specs, validated automotive-grade protection behavior, confirmed SSOP-16 pin mapping, and real-world USB 2.0 signal integrity performance under hot-plug and fault conditions.

Technical Context

The TPD3S716QDBQRQ1 integrates dual protection domains: a low-R_ON nFET VBUS switch with fast overvoltage response (2 µs) and independent high-bandwidth analog data switches (1050 MHz differential BW) with 200-ns OVP shutdown. Its architecture separates enable control (VEN/DEN), fault signaling (open-drain FLT), and current-limit adjustment (IADJ/RADJ) to support both host and client/OTG modes without external logic.

Protection logic includes concurrent short-to-battery detection on VBUS_CON, VD+, and VD– with independent thresholds (5.6–6.0 V rising for VBUS; VIN+0.6 to VIN+1.0 V for data lines), thermal shutdown (150–180 °C trip), and reverse supply detection (140–260 mV hysteresis). All protection events assert FLT within ≤14 µs and disable respective paths without latch-up.

Key Specifications

Pinout & Package

TPD3S716QDBQRQ1 is housed in a 16-pin SSOP package (4.9 mm × 3.9 mm) with flow-through layout optimized for USB signal routing and thermal dissipation (θ_JA = 98.8°C/W, θ_JB = 41.6°C/W).

Key Features

Applications

Equivalent & Alternatives

The following parts are listed as comparable options for similar USB 2.0 interface protection applications.

Compared with TPD4S012QDQARQ1 and TPD2S701QDSGRQ1, the TPD3S716QDBQRQ1 uniquely combines full USB 2.0 data-path switching, adjustable 2.4-A VBUS current limiting, and concurrent short-to-battery protection on all three lines - making it the only single-chip solution qualified for demanding automotive head unit and telematics host applications.

Availability

TPD3S716QDBQRQ1 is available at Aetrix Electronics and suitable for automotive infotainment systems, telematics control units, and rear-seat entertainment modules requiring stable component supply across extended temperature ranges and long production lifecycles.

Supply support for TPD3S716QDBQRQ1 includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.

Manufacturer

Texas Instruments is a global semiconductor leader specializing in analog, embedded processing, and automotive electronics, with decades of automotive qualification expertise and functional safety infrastructure.

The TPD3S716QDBQRQ1 belongs to TI's automotive-qualified USB interface protection product line, designed specifically to meet stringent AEC-Q100 reliability, ESD robustness, and short-circuit resilience requirements in vehicle infotainment and connectivity systems.

FAQ

What is the maximum continuous current supported by the TPD3S716QDBQRQ1 VBUS switch?

The TPD3S716QDBQRQ1 supports a maximum continuous VBUS current of 2.4 A when configured with a 57.6-kΩ RADJ resistor to ground on the IADJ pin. This rating assumes proper PCB thermal design per the datasheet's Layout Optimized for Thermal Performance section, including adequate copper area and vias to minimize junction temperature rise above 125°C.

Does the TPD3S716QDBQRQ1 provide protection against 18-V short-to-battery events on both VBUS and data lines?

Yes, the TPD3S716QDBQRQ1 provides 18-V short-to-battery tolerance on VBUS_CON (pins 2 and 3), VD+ (pin 6), and VD– (pin 5). This is verified per the Absolute Maximum Ratings table and confirmed in the Short-to-Battery test waveforms (Figures 6-10 and 6-12–6-13), where the device shuts off affected paths within 2–4 µs without latch-up or damage.

How does the TPD3S716QDBQRQ1 handle USB 2.0 high-speed (480 Mbps) signal integrity?

The TPD3S716QDBQRQ1 preserves USB 2.0 high-speed signal integrity via 1050-MHz differential bandwidth, 6.9-pF on-capacitance, and <–28-dB crosstalk at 480 MHz. Figure 6-16 in the datasheet shows a compliant eye diagram with TPD3S716QDBQRQ1 in-circuit, confirming minimal jitter and amplitude degradation compared to the baseline (Figure 6-15).

Can the TPD3S716QDBQRQ1 operate in both host and client (OTG) USB modes?

Yes, the TPD3S716QDBQRQ1 supports both host and client/OTG modes through independent active-low enable pins: VEN controls the VBUS switch, and DEN controls the D+/D– analog switches. Driving VEN low while holding DEN low enables host mode; driving only DEN low (with VEN high) enables client mode - no external logic required.

What fault conditions trigger the FLT pin on the TPD3S716QDBQRQ1?

The FLT pin asserts low for overvoltage (VBUS >6.0 V or VD+/VD– >VIN+1.0 V), overcurrent (hiccup mode triggered), short-to-ground (VBUS_CON <2.5 V), thermal shutdown (>150°C), and reverse supply (VBUS_CON – VBUS_SYS >260 mV). FLT remains asserted until the fault clears and recovery timing (e.g., 100-ms retry for OCP) completes.