Analog Devices Inc. ADXL356CEZ

Overview

ADXL356CEZ from Analog Devices is a hermetically sealed, low-noise, low-drift, analog-output 3-axis MEMS accelerometer supporting ±10 g and ±40 g measurement ranges. It delivers 75 μg/√Hz noise spectral density, 0.75 mg/°C max 0 g offset drift over −40°C to +125°C, and 150 μA supply current in measurement mode. It is used in precision tilt sensing, structural health monitoring, and seismic imaging where long-term stability and minimal calibration are critical.

For engineers reviewing the ADXL356CEZ datasheet, ADXL356CEZ pinout, ADXL356CEZ application, or ADXL356CEZ equivalent, key selection criteria include analog bandwidth configurability, hermetic LCC package stability, ±10/±40 g range flexibility, integrated temperature sensor output, and compatibility with high-reliability industrial and geophysical instrumentation.

Technical Context

The ADXL356CEZ implements a fully differential capacitive sensing architecture with on-chip analog signal conditioning, ratiometric voltage outputs (XOUT/YOUT/ZOUT referenced to V1P8ANA), and user-selectable full-scale range via the RANGE pin. Its analog filter provides a fixed −3 dB bandwidth of 2.4 kHz and supports stable operation across its full operating temperature range.

Power management includes dual LDO regulators (V1P8ANA and V1P8DIG), enabling flexible supply configurations: VSUPPLY (2.25–3.6 V) with internal regulation, or direct 1.8 V supplies when LDOs are bypassed. Standby mode draws only 21 μA, and turn-on time is under 10 ms.

Key Specifications

Pinout & Package

ADXL356CEZ uses a 14-terminal, 6 mm × 5.6 mm × 2.2 mm ceramic leadless chip carrier (LCC) with hermetic sealing for long-term stability in harsh environments.

Key Features

Applications

Equivalent & Alternatives

The following parts are listed as comparable options for similar 3-axis analog-output accelerometer applications.

Compared with ADXL354BEZ, ADXL356CEZ trades lower noise for wider dynamic range (±40 g), making it suitable for mixed shock-and-vibration environments. Compared with ADXL355CEZ, ADXL356CEZ avoids digital interface complexity and preserves analog signal integrity for legacy or noise-sensitive acquisition systems.

Availability

ADXL356CEZ is available at Aetrix Electronics and suitable for structural health monitoring, seismic data acquisition, and precision tilt sensing requiring stable component supply across extended temperature and long-life deployments.

Supply support for ADXL356CEZ includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.

Manufacturer

Analog Devices, Inc. is a global semiconductor company specializing in high-performance analog, mixed-signal, and digital signal processing technologies for precision measurement and control.

The ADXL356CEZ belongs to Analog Devices' high-stability MEMS accelerometer product line, engineered for applications demanding minimal calibration, long-term repeatability, and operation in extreme environmental conditions.

FAQ

What is the full-scale range configuration method for ADXL356CEZ?

The ADXL356CEZ supports ±10 g and ±40 g full-scale ranges selected by the RANGE pin: connect RANGE to ground for ±10 g (sensitivity ~80 mV/g), or to VDDIO for ±40 g (sensitivity ~20 mV/g). This hardware-selectable range eliminates software configuration overhead and ensures deterministic behavior at power-up. The ADXL356CEZ datasheet specifies nonlinearity as 0.1% FSR at ±10 g and 1.3% FSR at ±40 g, confirming range-dependent accuracy trade-offs.

Does ADXL356CEZ require external ADC conversion?

Yes, ADXL356CEZ is an analog-output device: XOUT, YOUT, and ZOUT deliver ratiometric voltage signals (referenced to V1P8ANA) that must be digitized by an external ADC. For example, at ±10 g range, 1 g produces ~80 mV, so a 16-bit ADC with 1.8 V reference resolves ~27 μg per LSB. This architecture preserves signal fidelity and avoids quantization noise introduced by on-chip digitization, unlike the digital-output ADXL355CEZ or ADXL357 variants.

How does the hermetic package of ADXL356CEZ improve long-term performance?

The ADXL356CEZ uses a 14-terminal ceramic LCC package with hermetic sealing to prevent moisture ingress and internal contamination. This construction directly enables its industry-leading 0.75 mg/°C max 0 g offset drift and <±5 mg offset repeatability over 10 years - critical for applications like seismic monitoring where field recalibration is impossible. Non-hermetic accelerometers typically exhibit 2–5× higher drift due to humidity-induced stress on MEMS structures.

Can ADXL356CEZ operate from a single 3.3 V supply?

Yes, ADXL356CEZ operates from a single 3.3 V VSUPPLY (within 2.25–3.6 V range), with internal LDO regulators generating clean 1.8 V analog (V1P8ANA) and digital (V1P8DIG) supplies. When using this configuration, V1P8ANA and V1P8DIG must be decoupled with 1 μF ceramic capacitors, and VSUPPLY must remain connected - disconnecting it forces external 1.8 V supplies. Total supply current is 150 μA in measurement mode, enabling low-power designs.

What is the purpose and implementation of self-test in ADXL356CEZ?

The ADXL356CEZ implements electromechanical self-test using ST1 and ST2 pins: pulling ST1 low and ST2 high applies electrostatic force to the proof mass, producing a calibrated ~1.25 g output on ZOUT independent of range setting. This verifies sensor functionality, bond wire integrity, and analog signal chain gain/offset without external stimulus. Self-test is specified to produce 0.5–3.0 g output change and is recommended during system power-up or periodic diagnostics to meet IEC 61508 functional safety requirements.