Analog Devices Inc. ADXL358CCCZ-RL7

Overview

ADXL358CCCZ-RL7 from Analog Devices is a low-noise, low-drift, 3-axis MEMS accelerometer supporting ±10 g and ±40 g full-scale ranges, with 80 µg/√Hz spectral noise density, ±0.2 mg/°C 0 g offset drift over −40°C to +125°C, and 150 µA measurement-mode current draw. It delivers precision inertial sensing for seismic imaging, structural health monitoring, and high-stability tilt sensing.

For engineers reviewing the ADXL358CCCZ-RL7 datasheet, ADXL358CCCZ-RL7 pinout, ADXL358CCCZ-RL7 application, or ADXL358CCCZ-RL7 equivalent, this page provides verified specifications, LGA package layout, analog output ratiometricity to V1P8ANA, self-test functionality, and real-world selection guidance for high-reliability industrial and geophysical systems.

Technical Context

The ADXL358CCCZ-RL7 implements fully differential micromachined sensing elements-lateral x/y-axis comb drives and vertical teeter-totter z-axis-with independent signal paths minimizing cross-axis coupling and thermal drift. Its analog outputs (XOUT/YOUT/ZOUT) are ratiometric to V1P8ANA, requiring matched reference sourcing for ADC interfacing to preserve inherent 0.1% FSR nonlinearity and <0.1 g vibration rectification error.

It integrates an antialiasing filter with fixed ~1.5 kHz −3 dB corner and achieves a total system bandwidth of 2.4 kHz (−3 dB), shaped by combined MEMS resonance at 5.5 kHz and sinc-like filter response. Power sequencing mandates VDDIO applied before VSUPPLY when using internal LDOs, or strict 10 µs staggered ramp-up for external V1P8ANA/V1P8DIG supplies.

Key Specifications

Pinout & Package

ADXL358CCCZ-RL7 uses a 14-terminal, 4 mm × 4 mm × 1.04 mm Land Grid Array (LGA) package (CC-14-2), optimized for minimal board area and stable mechanical mounting in high-shock environments.

Key Features

Applications

Equivalent & Alternatives

The following parts are listed as comparable options for similar 3-axis analog-output MEMS accelerometer applications.

Compared with ADXL358CCCZ-RL7, ADXL357BCCZ-RL7 offers marginally better noise performance but sacrifices ±40 g capability critical for impact detection, while ADXL355BCCZ-RL7 trades analog precision and on-chip thermal sensing for digital integration and reduced system-level BOM count.

Availability

ADXL358CCCZ-RL7 is available at Aetrix Electronics and suitable for seismic imaging, structural health monitoring, and precision tilt sensing requiring stable component supply across extended temperature ranges and multi-year production cycles.

Supply support for ADXL358CCCZ-RL7 includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.

Manufacturer

Analog Devices is a global leader in high-performance analog, mixed-signal, and digital signal processing semiconductors, serving industrial, automotive, communications, and healthcare markets since 1965.

The ADXL358 product line delivers ultra-stable, low-noise MEMS accelerometers engineered for precision inertial measurement in harsh environments where long-term calibration stability and wide temperature operation are mandatory.

FAQ

What full-scale ranges does the ADXL358CCCZ-RL7 support, and how are they selected?

The ADXL358CCCZ-RL7 supports ±10 g and ±40 g full-scale ranges. Selection is controlled by the RANGE pin: grounding it configures ±10 g (80 mV/g sensitivity), while tying it to VDDIO selects ±40 g (20 mV/g). This pin-selectable architecture allows one hardware design to serve dual dynamic range requirements without firmware changes. The ADXL358CCCZ-RL7 datasheet confirms this behavior is guaranteed across −40°C to +125°C.

How does the ratiometric output of ADXL358CCCZ-RL7 improve measurement accuracy?

The XOUT, YOUT, and ZOUT analog outputs of ADXL358CCCZ-RL7 are ratiometric to V1P8ANA, meaning their zero-g bias (V1P8ANA/2) and sensitivity scale directly with that supply voltage. When digitized using an ADC whose reference is also V1P8ANA-such as the AD7682-the system inherently cancels common-mode supply variations. This preserves the ADXL358CCCZ-RL7's specified 0.1% FSR nonlinearity and ±0.2 mg/°C offset drift without additional calibration.

What is the purpose of the integrated temperature sensor in ADXL358CCCZ-RL7?

The ADXL358CCCZ-RL7 includes a factory-calibrated temperature sensor outputting 967 mV at 25°C with a linear 3.0 mV/°C scale factor. This enables real-time die temperature monitoring for compensating sensitivity and offset drift in post-processing or closed-loop systems. Unlike external sensors, it shares the same thermal mass as the MEMS element, eliminating thermal lag and mismatch-critical for maintaining ADXL358CCCZ-RL7's ±0.2 mg/°C drift spec in rapidly changing environments.

Can ADXL358CCCZ-RL7 operate with external 1.8 V supplies instead of the internal LDO?

Yes, ADXL358CCCZ-RL7 supports external V1P8ANA and V1P8DIG supplies. To enable this mode, VSUPPLY must be tied to VSS (ground), disabling the internal LDO regulators. Both external supplies must be 1.62 V to 1.98 V, with ≤50 mV difference between them. Power sequencing requires VDDIO first, then V1P8DIG after ~10 µs, then V1P8ANA after another ~10 µs-details confirmed in the ADXL358CCCZ-RL7 datasheet Section "Power Sequencing".

What is the self-test capability of ADXL358CCCZ-RL7, and how is it verified?

The ADXL358CCCZ-RL7 features electromechanical self-test activated by driving ST1 and ST2 pins high. ST1 enables test mode; ST2 applies electrostatic force to the z-axis proof mass. The resulting output delta is ≥1.0 g (typical 1.7 g) on ZOUT, validating mechanical integrity and signal chain functionality. Per datasheet Table 1, this z-axis response is the only self-test parameter guaranteed-x/y-axis deltas are unspecified and not validated for functional pass/fail.