Analog Devices Inc. ADXL375SCCZ-EP

Overview

ADXL375SCCZ-EP from Analog Devices is a radiation-hardened, 3-axis digital MEMS accelerometer engineered for high-g shock event detection in defense and aerospace systems. It delivers ±200 g measurement range, 16-bit output resolution, 1.6 kHz −3 dB bandwidth, and operates across −55°C to +105°C. Its embedded 32-level FIFO and dual interrupt outputs enable autonomous impact logging in flight recorders and munitions telemetry.

For engineers reviewing the ADXL375SCCZ-EP datasheet, ADXL375SCCZ-EP pinout, ADXL375SCCZ-EP application, or ADXL375SCCZ-EP equivalent, key selection criteria include extended temperature operation, 10,000 g shock survival, SPI/I²C dual-interface support, low-power wake-up timing (1.4 ms at 3.2 kHz ODR), and enhanced product qualification per AQEC standards.

Technical Context

The ADXL375SCCZ-EP integrates a triaxial capacitive sensor array with low-noise signal conditioning, 16-bit ADCs, and configurable digital filters. Its power management supports dynamic bandwidth scaling and selectable low-power modes (35 µA at 3 Hz ODR, 145 µA at ≥100 Hz).

Interrupt logic enables hardware-triggered event capture via INT1/INT2 pins for activity/inactivity, shock detection, and FIFO status. The device uses a fixed 14-terminal LGA package with dedicated VDD I/O and VS supplies, supporting independent 1.7–3.6 V I/O and 2.0–3.6 V core voltage rails.

Key Specifications

Pinout & Package

ADXL375SCCZ-EP is housed in a 3 mm × 5 mm × 1 mm, 14-terminal land grid array (LGA) package (CC-14-1), optimized for high-reliability PCB assembly under thermal and mechanical stress.

Key Features

Applications

Equivalent & Alternatives

The following parts are listed as comparable options for similar high-g accelerometer applications.

Compared with ADXL375SCCZ-EP, ADXL372BCCZ-EP trades shock-response fidelity for lower average power, while ADXL357BEZ-RL offers superior noise performance but lacks defense-grade reliability controls, making ADXL375SCCZ-EP the sole choice for AQEC-compliant high-g event logging.

Availability

ADXL375SCCZ-EP is available at Aetrix Electronics and suitable for defense avionics, aerospace telemetry, and industrial shock monitoring requiring stable component supply, long-term lifecycle assurance, and controlled manufacturing baseline traceability.

Supply support for ADXL375SCCZ-EP includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.

Manufacturer

Analog Devices is a global leader in high-performance analog, mixed-signal, and digital signal processing semiconductors, serving precision instrumentation, industrial automation, and defense markets since 1965.

The ADXL375-EP product line delivers radiation-tolerant, extended-temperature accelerometers for mission-critical shock and impact sensing in space, missile, and armored vehicle platforms.

FAQ

What is the qualified operating temperature range for ADXL375SCCZ-EP?

The ADXL375SCCZ-EP is qualified for continuous operation from −55°C to +105°C, meeting AQEC standard requirements for defense and aerospace applications. This range is verified across all electrical parameters in the datasheet, including offset drift, sensitivity stability, and power consumption. The device maintains full functionality-including FIFO operation, interrupt generation, and self-test-across this entire span without derating. ADXL375SCCZ-EP achieves this via controlled manufacturing baseline and single-fab/test-site production.

Does ADXL375SCCZ-EP support both SPI and I²C interfaces simultaneously?

No, ADXL375SCCZ-EP supports SPI and I²C interfaces, but not simultaneously. Interface selection is determined by the state of the CS pin: CS low enables SPI mode; CS high enables I²C mode. Pin 12 (SDO/ALT ADDRESS) also serves as I²C address select, allowing two I²C addresses (0x52 or 0x53). The ADXL375SCCZ-EP does not require external level shifters due to its 1.7–3.6 V I/O voltage range, and both protocols operate reliably across the full −55°C to +105°C temperature range.

What is the shock survival rating of ADXL375SCCZ-EP, and is it tested powered or unpowered?

The ADXL375SCCZ-EP has a shock survival rating of 10,000 g for both powered and unpowered conditions, as specified in the Absolute Maximum Ratings table. This rating applies to acceleration applied along any axis and is validated per MIL-STD-883 Method 2002. The device retains mechanical integrity and post-shock functionality-verified by functional testing after exposure. ADXL375SCCZ-EP's robustness stems from monolithic MEMS design and CC-14-1 LGA packaging, making it suitable for ordnance, crash, and launch environments.

How does the embedded FIFO in ADXL375SCCZ-EP reduce system power consumption?

The ADXL375SCCZ-EP's 32-level FIFO stores acceleration samples autonomously, allowing the host processor to remain in deep sleep until FIFO triggers an interrupt (e.g., full, watermark, or overrun). This eliminates continuous polling, reducing average system current by up to 90% in intermittent-monitoring applications. With ODR set to 100 Hz, the FIFO can buffer >300 ms of data before requiring host intervention. ADXL375SCCZ-EP maintains FIFO integrity across temperature and supply variations, ensuring deterministic data capture without software overhead.

Is self-test functionality available on ADXL375SCCZ-EP, and what is its output magnitude?

Yes, ADXL375SCCZ-EP includes a factory-calibrated self-test function that induces a known mechanical deflection, producing a 6.4 g response on the Z-axis when activated via the SELF_TEST bit (DATA_FORMAT register, Address 0x31). The output change is measured as differential g-value between self-test enabled and disabled states. This feature is fully operational across the −55°C to +105°C range and requires no external stimuli. Self-test validation is mandatory for pre-deployment checks in ADXL375SCCZ-EP-based safety-critical systems.