NXP Semiconductors MMA1200KEGR2

Overview

MMA1200KEGR2 from Freescale Semiconductor is a surface-mount, silicon capacitive, micromachined Z-axis accelerometer with ±250g full-scale range, factory-calibrated 4th-order Bessel low-pass filter (f_–3dB = 360–440 Hz), and integrated self-test functionality. It delivers ratiometric linear output (7.6–8.4 mV/g/V) with zero-g offset at VDD/2 and operates across –40°C to +125°C for automotive-grade vibration and impact monitoring.

For engineers reviewing the MMA1200KEGR2 datasheet, MMA1200KEGR2 pinout, MMA1200KEGR2 application, or MMA1200KEGR2 equivalent, key selection considerations include its SOIC-16 package, self-test status latching, low-voltage detect threshold (2.7–4.0 V), clock monitor fail detection (50–260 kHz), and AEC-Q100 Grade 2 qualification.

Technical Context

The MMA1200KEGR2 integrates a hermetically sealed polysilicon g-cell transducer with a CMOS ASIC featuring switched-capacitor signal conditioning, temperature compensation, and EPROM-trimmed calibration. Its 4-pole Bessel filter preserves pulse shape integrity without external components, while the self-test applies electrostatic force to the movable plate via a dedicated ST pin.

Fault detection includes low-voltage detection (LVD), clock oscillator frequency monitoring, and EPROM parity checking-all latched to the STATUS pin and resettable via ST pulse. Output is ratiometric (sensitivity and offset scale linearly with VDD), enabling robust interfacing with microcontroller ADCs under supply variation.

Key Specifications

Pinout & Package

Package: 16-lead SOIC (Case 475-01), RoHS-compliant, Pb-free, surface-mountable with standard reflow profile.

Key Features

Applications

Equivalent & Alternatives

The following parts are listed as comparable options for similar accelerometer applications.

Compared with ADXL372BCPZ and MMA8452Q, the MMA1200KEGR2 uniquely combines ±250g analog output, factory-trimmed Bessel filtering, and latchable STATUS diagnostics-making it irreplaceable in AEC-Q100-compliant safety-critical systems where signal integrity and fault visibility are mandatory.

Availability

MMA1200KEGR2 is available at Aetrix Electronics and suitable for automotive airbag control, industrial vibration monitoring, drop-test logging, and heavy-equipment impact sensing requiring stable component supply across extended temperature ranges and long production lifecycles.

Supply support for MMA1200KEGR2 includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.

Manufacturer

Freescale Semiconductor (now part of NXP Semiconductors) is a global leader in automotive, industrial, and networking semiconductors, with deep expertise in sensor signal conditioning and mixed-signal IC design.

The MMA series was engineered specifically for high-reliability automotive safety and industrial condition monitoring, emphasizing hermetic packaging, AEC-Q100 qualification, and integrated self-test for functional safety compliance.

FAQ

What is the operating voltage range for the MMA1200KEGR2?

The MMA1200KEGR2 operates over a supply voltage range of 4.75 V to 5.25 V for full calibration compliance. While it may function outside this range, sensitivity and offset are only guaranteed within these limits. The device includes low-voltage detection (LVD) that triggers at 2.7–4.0 V, and the STATUS pin latches high if VDD falls below the trip point-ensuring system-level fault visibility. This behavior is documented in Table 2 of the MMA1200KEG datasheet Rev. 0.

Does the MMA1200KEGR2 require external components for basic operation?

Yes-the MMA1200KEGR2 requires two external passive components for reliable operation: a 0.1 μF ceramic capacitor between VDD and VSS for power supply decoupling, and an RC filter (1 kΩ resistor + 0.01 μF capacitor) on the VOUT pin to suppress switched-capacitor clock noise. These are specified in Figure 5 and Note 4 of the MMA1200KEG datasheet. No external resistors or capacitors are needed for filter cutoff or calibration, as all trimming is performed at wafer level and stored in EPROM.

How does the self-test function work on the MMA1200KEGR2?

The MMA1200KEGR2 self-test applies a calibrated electrostatic force to the movable g-cell plate via the ST pin, producing a measurable output shift equivalent to ±55–75 g. When ST is driven high, the internal ASIC activates the test plate, deflecting the center plate and generating a proportional VOUT change. Simultaneously, the STATUS pin goes high and remains latched until ST is pulsed again for ≥100 μs-verifying both mechanical integrity and signal chain functionality. This is detailed in Section "Self-Test" and Table 2 of the MMA1200KEG datasheet.

Is the MMA1200KEGR2 pin-compatible with other devices in the MMA1200 family?

Yes-the MMA1200KEGR2 shares identical pinout, package (SOIC-16, Case 475-01), and electrical interface with MMA1200EG, MMA1200EGR2, and MMA1200KEG. The "K" suffix denotes alternate silicon sourcing but no functional or mechanical differences; "R2" indicates tape-and-reel packaging. All variants use the same pin assignments, timing, and registerless analog interface-enabling drop-in replacement in existing designs without PCB changes.

What does the STATUS pin indicate on the MMA1200KEGR2?

The STATUS pin on the MMA1200KEGR2 is an open-drain output that latches high when any of three fault conditions occur: supply voltage drops below the LVD threshold (2.7–4.0 V), internal clock frequency falls outside 50–260 kHz, or EPROM parity becomes odd. It also goes high during self-test activation. The latch resets only upon receiving a ≥100 μs high pulse on ST-unless the underlying fault persists. This dual-role behavior is defined in Table 2 and the "Status" section of the MMA1200KEG datasheet.