NXP Semiconductors MMA2201EG

Overview

MMA2201EG from NXP Semiconductors (formerly Freescale) is a silicon capacitive, micromachined ±40g single-axis X-direction accelerometer with integrated signal conditioning, 4th-order Bessel low-pass filter, and factory-calibrated self-test. It delivers ratiometric linear output (50 mV/g/V typical sensitivity), operates from 4.75–5.25 V, draws 5.0 mA typical supply current, and is qualified to AEC-Q100 Grade 2 (–40°C to +105°C) for automotive and industrial vibration monitoring.

For engineers reviewing the MMA2201EG datasheet, MMA2201EG pinout, MMA2201EG application, or MMA2201EG equivalent, this page provides verified technical context, SOIC-16 package mapping, self-test and status pin behavior, noise performance (110 mVrms, 10 Hz–1 kHz), and calibrated alternatives for low-g motion sensing in safety-critical embedded systems.

Technical Context

The MMA2201EG implements a surface-micromachined polysilicon g-cell with hermetic wafer-level sealing, paired with a CMOS ASIC that performs switched-capacitor capacitance-to-voltage conversion, temperature compensation, and 360–440 Hz Bessel-filtered analog output. Its self-test applies electrostatic force to deflect the center plate, generating a calibrated 10–14 g output shift.

Fault detection includes low-voltage detect (trip at 2.7–4.0 V), clock monitor (150–400 kHz fail window), and EPROM parity check - all latched on the STATUS pin, resettable via ST pin pulse. Output is ratiometric to VDD, with zero-g offset trimmed to 2.5 V ±0.15 V at 25°C and 5.0 V supply.

Key Specifications

Pinout & Package

Package: 16-lead SOIC (Case 475-01), 7.5 mm × 10.3 mm body, 1.27 mm pitch, surface-mountable with solder-mask-defined footprint per Figure 7.

Key Features

Applications

Equivalent & Alternatives

The following parts are listed as comparable options for similar low-g analog accelerometer applications.

Compared with ADXL326BCPZ, MMA2201EG offers integrated diagnostics and AEC-Q100 qualification at the cost of lower bandwidth; compared with MMA2201KEG, it shares identical performance and pin compatibility but originates from a different wafer fab - making it suitable for dual-sourcing strategies without redesign.

Availability

MMA2201EG is available at Aetrix Electronics and suitable for computer hard drive protection, automotive airbag diagnostics, and industrial bearing vibration monitoring requiring stable component supply across extended temperature ranges and long product lifecycles.

Supply support for MMA2201EG includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.

Manufacturer

NXP Semiconductors is a global semiconductor leader focused on secure connectivity solutions for automotive, industrial, and IoT applications, with roots in Freescale's sensor and microcontroller heritage.

The MMA2201EG belongs to NXP's legacy Xtrinsic analog sensor portfolio, designed specifically for robust, calibrated motion sensing in safety-critical automotive and industrial systems where long-term stability and fault visibility are mandatory.

FAQ

What is the supply voltage range for the MMA2201EG?

The MMA2201EG operates from 4.75 V to 5.25 V. Within this range, it functions as a fully calibrated linear accelerometer. Operation outside this window may yield linear output but without guaranteed calibration accuracy. The device includes a low-voltage detect circuit with a trip point between 2.7 V and 4.0 V, reported via the STATUS pin. Always use a 0.1 µF ceramic capacitor directly at the VDD pin for stable operation of the MMA2201EG.

How does the self-test function work on the MMA2201EG?

The MMA2201EG self-test applies an electrostatic force to the micromachined center plate via a dedicated self-test plate, causing a calibrated mechanical deflection equivalent to 10–14 g. This generates a corresponding shift in the VOUT voltage, verifying both transducer integrity and signal chain functionality. Activation requires a logic-high pulse ≥100 µs on the ST pin, and the MMA2201EG STATUS pin reflects test initiation and fault conditions.

What is the purpose of the STATUS pin on the MMA2201EG?

The STATUS pin on the MMA2201EG is an open-drain output that latches high upon detection of low-voltage condition, clock frequency failure (outside 150–400 kHz), or EPROM parity error. It remains asserted until cleared by a rising edge on the ST pin - unless the underlying fault persists. This enables system-level fault logging and diagnostic reporting without continuous polling, a key feature of the MMA2201EG for functional safety applications.

Can the MMA2201EG be used in automotive applications?

Yes, the MMA2201EG is qualified to AEC-Q100 Rev. F Grade 2 (–40°C to +105°C), making it suitable for under-hood and cabin automotive applications including airbag crash sensing, rollover detection, and chassis stability control. Its hermetic wafer-level seal, integrated self-test, and fault-latched STATUS output support ASIL-B diagnostic requirements - all confirmed in the official MMA2201EG datasheet.

What filtering is implemented in the MMA2201EG and why is it important?

The MMA2201EG integrates a 4th-order switched-capacitor Bessel filter with a –3 dB bandwidth of 360–440 Hz. Unlike Butterworth or Chebyshev filters, the Bessel implementation prioritizes linear phase response to preserve pulse shape integrity - essential for accurate capture of transient events like impacts or bearing faults. No external components are needed, reducing BOM count and layout sensitivity for the MMA2201EG.