NXP Semiconductors MMA2201EGR2

Overview

MMA2201EGR2 from NXP Semiconductors (formerly Freescale) is a silicon capacitive, micromachined ±40g single-axis X-direction accelerometer with integrated signal conditioning, 4th-order Bessel low-pass filter, and factory-calibrated self-test. It delivers ratiometric linear output (50 mV/g/V typical sensitivity), operates from 4.75–5.25 V, draws 5.0 mA typical supply current, and is qualified to AEC-Q100 Grade 2 (–40°C to +105°C) for automotive and industrial vibration monitoring.

For engineers reviewing the MMA2201EGR2 datasheet, MMA2201EGR2 pinout, MMA2201EGR2 application, or MMA2201EGR2 equivalent, this page provides verified technical context, SOIC-16 pin mapping, real-world use cases in hard drive protection and appliance control, and two validated alternative accelerometers with documented functional and packaging differences.

Technical Context

The MMA2201EGR2 implements a surface-micromachined polysilicon g-cell with back-to-back capacitors, read via switched-capacitor ASIC circuitry. Its 4-pole Bessel filter (360–440 Hz –3 dB bandwidth) preserves pulse shape integrity without external components, and its ratiometric output scales linearly with both acceleration and supply voltage.

Self-test is initiated by a logic-high pulse on ST pin, generating calibrated electrostatic deflection of the movable plate; STATUS pin latches high on fault conditions including low-voltage detection (VLVD = 3.25 V typ), clock monitor failure (f_min = 150–400 kHz), or EPROM parity error - resettable only by ST pulse if fault clears.

Key Specifications

Pinout & Package

Package: 16-lead SOIC (Case 475-01), 7.5 mm × 10.3 mm body, 1.27 mm pitch, tape-and-reel packaging (EGR2 suffix).

Key Features

Applications

Equivalent & Alternatives

The following parts are listed as comparable options for similar single-axis analog accelerometer applications.

Compared with ADXL322BCPZ-RL7 and MMA8451Q, the MMA2201EGR2 uniquely combines ±40g analog output, factory-calibrated self-test with STATUS latching, and AEC-Q100 Grade 2 qualification - making it optimal for ruggedized vibration and impact-sensing applications where deterministic analog behavior and hardware fault visibility are required.

Availability

MMA2201EGR2 is available at Aetrix Electronics and suitable for computer hard drive protection, appliance control, and industrial vibration monitoring requiring stable component supply, long-lifecycle support, and automotive-grade reliability.

Supply support for MMA2201EGR2 includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.

Manufacturer

NXP Semiconductors is a global semiconductor leader focused on secure connectivity solutions for automotive, industrial, and IoT applications.

The MMA2201EGR2 belongs to NXP's legacy Xtrinsic analog sensor portfolio, designed specifically for high-reliability, single-axis acceleration sensing in harsh environments where hermetic sealing, self-test validation, and AEC-Q100 compliance are mandatory.

FAQ

What is the operating voltage range for the MMA2201EGR2?

The MMA2201EGR2 operates within a strict 4.75 V to 5.25 V supply range. Operation outside this window invalidates factory calibration and may cause undefined behavior. The device draws 5.0 mA typical supply current and requires a 0.1 µF ceramic capacitor directly at the VDD pin for stable operation. This narrow range ensures ratiometric accuracy and thermal stability across its –40°C to +105°C operating temperature envelope.

Does the MMA2201EGR2 support self-test, and how is it activated?

Yes, the MMA2201EGR2 includes a calibrated self-test feature activated by applying a logic-high pulse (≥100 µs duration) to the ST pin (Pin 4). This generates electrostatic deflection equivalent to 10–14 g acceleration, producing a corresponding output shift on VOUT. The STATUS pin latches high during self-test and remains high if faults (e.g., low-voltage detection or clock failure) persist - confirming end-to-end functionality of both mechanical and electronic subsystems in the MMA2201EGR2.

What is the function of the STATUS pin on the MMA2201EGR2?

The STATUS pin (Pin 6) is an open-drain fault indicator that latches high upon occurrence of low-voltage detection (trip point 3.25 V typical), clock monitor failure (detection range 150–400 kHz), or EPROM parity error. It also goes high during self-test initiation. The latch resets only when a rising edge is applied to ST - but only if the underlying fault condition has cleared. This provides deterministic hardware-level fault visibility without MCU polling, a key requirement for safety-critical MMA2201EGR2 deployments.

Can the MMA2201EGR2 be used in automotive applications?

Yes, the MMA2201EGR2 is qualified to AEC-Q100 Rev. F Grade 2 (–40°C to +105°C), making it suitable for under-hood and cabin automotive applications including airbag pre-crash sensing, rollover detection, and hard drive protection in infotainment systems. Its wafer-level hermetic seal, robust shock survivability (2000 g unpowered), and integrated self-test meet stringent automotive reliability requirements - confirmed in the official MMA2201EGR2 datasheet revision history and qualification reports.

What filtering is implemented in the MMA2201EGR2, and why is it important?

The MMA2201EGR2 integrates a 4th-order switched-capacitor Bessel filter with a 360–440 Hz –3 dB bandwidth. Unlike Butterworth or Chebyshev filters, the Bessel implementation provides maximally flat group delay - preserving pulse shape integrity and transient fidelity. This is critical for impact detection, vibration waveform analysis, and motion-triggered responses where timing accuracy matters. No external components are needed, simplifying design and improving board-level noise immunity in the MMA2201EGR2.