NXP Semiconductors MMA2201KEGR2

Overview

MMA2201KEGR2 from NXP Semiconductors (formerly Freescale) is a silicon capacitive, micromachined ±40g X-axis accelerometer with integrated signal conditioning, 4th-order Bessel low-pass filter, and factory-calibrated self-test. It delivers ratiometric linear output (50 mV/g/V), operates from 4.75–5.25 V, draws 5 mA typical, and meets AEC-Q100 Grade 2 (–40°C to +105°C) for automotive and industrial vibration monitoring.

For engineers reviewing the MMA2201KEGR2 datasheet, MMA2201KEGR2 pinout, MMA2201KEGR2 application, or MMA2201KEGR2 equivalent, key selection criteria include its ±40g full-scale range, 360–440 Hz –3 dB bandwidth, 110 mV_RMS noise (10 Hz–1 kHz), STATUS fault-latch capability, and SOIC-16 package compatibility with board-level ESD protection and RC-filtered output interface.

Technical Context

The MMA2201KEGR2 implements a surface-micromachined polysilicon g-cell with back-to-back capacitors, read via switched-capacitor ASIC circuitry. Its on-chip 4-pole Bessel filter preserves pulse shape integrity without external components, and temperature compensation ensures stable offset and sensitivity across –40°C to +105°C.

Self-test applies electrostatic force to the movable plate via dedicated ST pin, producing calibrated 10–14 g output shift. Fault detection monitors low-voltage (VLVD = 3.25 V typ), clock frequency (f_min = 150–400 kHz), and EPROM parity, latching STATUS high until reset by ST pulse - enabling system-level functional verification pre-deployment.

Key Specifications

Pinout & Package

Package: 16-lead SOIC (Case 475-01), 7.5 mm × 10.3 mm body, 1.27 mm pitch, Pb-free (KEG suffix). Hermetically sealed at wafer level for high reliability in harsh environments.

Key Features

Applications

Equivalent & Alternatives

The following parts are listed as comparable options for similar single-axis analog-output accelerometer applications.

Compared with ADXL326BCPZ-RL7 and MMA8451Q, the MMA2201KEGR2 uniquely combines ±40g analog output, factory-calibrated self-test, and STATUS fault latching in a single SOIC-16 package - making it optimal for cost-sensitive, safety-aware analog systems where deterministic verification and minimal external components are essential.

Availability

MMA2201KEGR2 is available at Aetrix Electronics and suitable for vibration monitoring and recording, computer hard drive protection, and appliance control requiring stable component supply across automotive, industrial, and consumer electronics programs.

Supply support for MMA2201KEGR2 includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.

Manufacturer

NXP Semiconductors is a global semiconductor leader focused on secure connectivity solutions for automotive, industrial, and IoT applications, with roots in Freescale's sensor and analog expertise.

The MMA2201KEGR2 belongs to NXP's legacy Xtrinsic analog sensor portfolio, designed specifically for robust, low-cost, single-axis acceleration sensing in safety-critical and high-reliability mechanical monitoring systems.

FAQ

What is the full-scale acceleration range of the MMA2201KEGR2?

The MMA2201KEGR2 has a full-scale acceleration range of ±40 g. This range is factory-set and does not require external configuration. It enables reliable detection of high-magnitude events such as drop impacts in portable electronics or sudden shocks in industrial machinery, while maintaining linearity and low noise performance across the entire span.

Does the MMA2201KEGR2 require external components for basic operation?

The MMA2201KEGR2 requires only a 0.1 µF decoupling capacitor on VDD and a 1 kΩ + 0.01 µF RC filter on VOUT to suppress clock feedthrough noise. No external resistors, capacitors, or trimming components are needed for zero-g offset, sensitivity, or filter cutoff - all are factory-calibrated and integrated, simplifying PCB layout and reducing BOM count.

How does the self-test function work on the MMA2201KEGR2?

The MMA2201KEGR2 self-test applies electrostatic force to the movable g-cell plate via the ST pin, producing a calibrated 10–14 g equivalent output shift at VOUT. This verifies both mechanical integrity (g-cell mobility) and electronic functionality (ASIC signal path) in situ. The STATUS pin reflects test completion and can latch fault conditions if anomalies are detected during the test.

What fault conditions does the STATUS pin indicate on the MMA2201KEGR2?

The STATUS pin on the MMA2201KEGR2 latches high for three fault conditions: low-voltage detection (VDD < 3.25 V typ), clock frequency failure (oscillator outside 150–400 kHz), or EPROM parity error. It remains asserted until cleared by a valid ST pin pulse, enabling persistent system-level fault logging without continuous polling.

Is the MMA2201KEGR2 compatible with standard SOIC-16 footprints?

Yes, the MMA2201KEGR2 uses Case 475-01 - a standard 16-lead SOIC package with 1.27 mm pitch and 7.5 mm × 10.3 mm body dimensions. Its footprint matches JEDEC MS-012AC, and the datasheet provides exact pad layout (Figure 7), ensuring drop-in compatibility with existing SOIC-16 assembly processes and reflow profiles.