NXP Semiconductors NT2H2421S0DUDZ

Overview

NT2H2421S0DUDZ from NXP Semiconductors is an NFC Forum Type 2 Tag-compliant security IC with 208 bytes of user memory, AES-128 cryptographic authentication, and Secure Unique NFC (SUN) message authentication. It delivers tamper-resistant product authentication, real-time integrity verification, and ECC-based originality signature for anti-counterfeiting in physical goods and IoT endpoints.

For engineers reviewing the NT2H2421S0DUDZ datasheet, NT2H2421S0DUDZ pinout, NT2H2421S0DUDZ application, or NT2H2421S0DUDZ equivalent, this page provides verified technical context, exact memory layout, SUN CMAC mirroring behavior, 3-pass mutual authentication flow, and wafer-level antenna interface requirements - all confirmed for the NT2H2421S0DUDZ variant.

Technical Context

The NT2H2421S0DUDZ implements a contactless RF interface compliant with ISO/IEC 14443 Type A and NFC Forum Tag 2 Type, operating at 13.56 MHz with 106 kbit/s data rate and 50 pF input capacitance. Its digital control unit integrates a TRNG, AES coprocessor, and anti-collision logic to support concurrent tag selection in multi-tag fields.

Memory is organized as 76 pages × 4 bytes (304 bytes total), with 208 bytes user-programmable (pages 04h–37h), pre-programmed 7-byte UID, ECC-based originality signature (pages 72h–75h), and configurable access protection via AUTH0 byte and dynamic lock bits. SUN functionality mirrors UID, NFC tap counter, and CMAC into NDEF via ASCII encoding on every read after reset.

Key Specifications

Pinout & Package

NT2H2421S0DUDZ is supplied as a bare die in FFC Bump format on 8-inch wafer, with 120 μm thickness and Au bumps. It requires external antenna connection and has no integrated package.

Key Features

Applications

Equivalent & Alternatives

The following parts are listed as comparable options for similar NFC tag security applications.

Compared with NT2H2421S0DUDZ, NT2H2421G0DUD offers identical security and memory functionality with matching wafer form factor, while NT3H2111W0FHK trades SUN/ECC authenticity for expanded memory and sector-based access control - making it unsuitable as a drop-in replacement for DNA-grade anti-counterfeiting.

Availability

NT2H2421S0DUDZ is available at Aetrix Electronics and suitable for anti-counterfeiting systems, supply chain traceability platforms, and NFC-enabled consumer engagement solutions requiring stable component supply and wafer-level integration flexibility.

Supply support for NT2H2421S0DUDZ includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.

Manufacturer

NXP Semiconductors is a global semiconductor leader specializing in secure connectivity solutions for automotive, industrial, and IoT markets, with core expertise in NFC, RFID, and embedded security.

The NTAG family - including NT2H2421S0DUDZ - was designed specifically for high-assurance physical-digital binding, delivering certified cryptographic primitives (AES-128, ECC) and hardware-enforced memory protection in ultra-low-power contactless ICs.

FAQ

What is the primary security function enabled by the SUN feature in NT2H2421S0DUDZ?

The Secure Unique NFC (SUN) feature in NT2H2421S0DUDZ automatically appends the IC's 7-byte UID, NFC tap counter, and AES-128 CMAC to the NDEF message via ASCII mirroring on every read after reset. This creates a cryptographically signed, time-variant payload that proves both tag authenticity and message integrity - preventing replay, cloning, or tampering without requiring external infrastructure.

Does NT2H2421S0DUDZ require external power or supporting circuitry beyond the antenna?

No, NT2H2421S0DUDZ operates entirely from harvested RF energy - it contains an integrated rectifier, voltage regulator, and POR circuit. Only an externally designed loop antenna connected between LA and LB pins is required. No external capacitors, resistors, or power sources are needed, simplifying integration into labels, inlays, or embedded modules.

How is memory protection implemented on NT2H2421S0DUDZ, and what access levels does it support?

NT2H2421S0DUDZ implements dual-layer memory protection: static lock bits (page 02h) and dynamic lock bits (page 38h) provide irreversible per-page or per-4-page write locking, while the AUTH0 configuration byte (page 39h) defines the starting page for 3-pass AES-128 mutual authentication. Pages below AUTH0 remain freely readable/writable; those at or above require authenticated access - supporting granular, field-programmable security policies.

What is the purpose of the ECC-based originality signature in NT2H2421S0DUDZ, and can it be customized?

The ECC-based originality signature in NT2H2421S0DUDZ is pre-programmed at manufacture to cryptographically prove NXP origin and factory integrity. It resides in dedicated memory pages (72h–75h) and can be customized during tag initialization using NXP's toolchain before permanent locking. Once locked, the signature cannot be altered - ensuring verifiable provenance throughout the product lifecycle.

Is NT2H2421S0DUDZ pin-compatible with earlier NTAG 2xx devices like NT2H2111?

No, NT2H2421S0DUDZ is not pin-compatible with NT2H2111 or other legacy NTAG 2xx variants. While all share LA/LB/GND/TEST pin functions, NT2H2421S0DUDZ introduces new configuration registers (e.g., CFG_B0, SUNCMAC_KEY), updated memory mapping (e.g., ECC signature location), and enhanced SUN mirroring logic - requiring updated antenna layout, firmware, and initialization sequences for full feature utilization.