NXP Semiconductors SL2S5102FUD,003
- Part No.:
- SL2S5102FUD,003
- Manufacturer:
- NXP Semiconductors
- Category:
- RFID, RF Access, Monitoring ICs
- Package:
- Die
- Datasheet:
-
SL2S5102FUD,003.pdf
- Description:
- IC RFID TRANSP 13.56MHZ DIE
- Quantity:
- Payment:

- Shipping:

Inventory:4,741
Please send an inquiry. Send us your inquiry, and we will respond immediately.
Product details
Overview
SL2S5102FUD,003 from NXP Semiconductors is an ISO/IEC 15693- and ISO/IEC 18000-3-compliant contactless RFID IC for smart labels, featuring 512-bit EEPROM (16 blocks × 4 bytes), 13.56 MHz operation, up to 1.5 m read range, and password-protected privacy, destroy, EAS, and AFI functions - deployed in industrial laundry tracking and asset management systems.
For engineers reviewing the SL2S5102FUD,003 datasheet, SL2S5102FUD,003 pinout, SL2S5102FUD,003 application, or SL2S5102FUD,003 equivalent, this page delivers verified electrical parameters, wafer-level terminal mapping, memory security architecture, and real-world use-case implementation guidance aligned with NXP's ICODE SLIX-L family specifications.
Technical Context
The SL2S5102FUD,003 integrates analog RF interface (13.56 MHz resonant coupling), digital controller with anticollision state machine, and 512-bit EEPROM - all powered contactlessly via inductive coupling without onboard battery. Its RF front-end supports high-speed 53 kbit/s data transfer using ASK modulation and 16-bit CRC error detection.
It implements true ISO/IEC 15693-3 anticollision with inventory and fast inventory page read commands, plus custom NXP commands including ENABLE PRIVACY (B Ah), DESTROY SLIX-L (B9h), and SET PASSWORD (B3h) - all requiring XOR-encoded 32-bit passwords derived from GET RANDOM NUMBER output.
Key Specifications
| Parameter | Value and Actual Design Meaning |
|---|---|
| RF Standard | Fully compliant with ISO/IEC 15693 and ISO/IEC 18000-3 - ensures interoperability with global vicinity RFID readers and gate systems. |
| Operating Frequency | 13.56 MHz - enables license-free worldwide deployment and compatibility with standard HF antenna designs. |
| Read Range | Up to 1.5 m (gate width) - determined by antenna geometry and reader field strength; no line-of-sight required. |
| Memory Capacity | 512 bits EEPROM (16 blocks × 4 bytes), organized into 4 pages - supports UID, AFI, DSFID, passwords, and user data with block-level write protection. |
| Data Rate | 53 kbit/s (high-speed mode) - achieved via single subcarrier ASK modulation; doubles effective throughput vs. legacy 26.48 kbit/s modes. |
| Security Features | 32-bit Privacy, Destroy, and EAS/AFI passwords; irreversible DESTROY SLIX-L command; ENABLE PRIVACY mode restricting responses to GET RANDOM NUMBER only. |
| Endurance & Retention | 100,000 write cycles and 50-year data retention - validated for long-life deployments in reusable industrial tags. |
Pinout & Package
SL2S5102FUD,003 is supplied as a bare die on film frame carrier (120 µm thickness), with four bonding pads: LA and LB (RF antenna inputs), GND (ground), and TEST (test input). No leaded package; requires flip-chip or wire-bond assembly onto custom antenna substrates.
| Pin/Terminal | Circuit Role | Design Meaning |
|---|---|---|
| LA | Antenna RF input | Primary RF coupling terminal; connects to one side of printed/wound antenna coil; forms resonant LC circuit with internal capacitance (Ci = 97 pF typical). |
| LB | Antenna RF input | Secondary RF coupling terminal; symmetric with LA; defines differential RF input path for optimized power harvesting and demodulation. |
| GND | Ground | Reference node for internal voltage regulation and RF demodulator bias; must be low-impedance connection in tag layout. |
| TEST | Test input | Dedicated probe point for wafer-level functional testing; not used in final application; left floating or grounded per design. |
Key Features
| Feature | Design Value |
|---|---|
| Privacy Mode Enforcement | Enables irreversible suppression of all command responses except GET RANDOM NUMBER until correct 32-bit Privacy password is retransmitted - meeting GDPR-aligned customer data protection requirements. |
| Fast Inventory Page Read | Delivers 53 kbit/s bidirectional throughput using B1h command - cuts multi-tag inventory time by ~50% versus standard INVENTORY PAGE READ (B0h) in high-density environments. |
| Password-Protected Memory Locking | Supports LOCK BLOCK, LOCK AFI, LOCK DSFID, and LOCK PASSWORD commands - prevents unauthorized modification of configuration or user data after initialization. |
| UID Uniqueness Guarantee | Factory-programmed 64-bit UID (NXP manufacturer code 04h + SLIX-L type 03h + serial) - immutable and traceable across full lifecycle, enabling secure device identity binding. |
| EAS Integration | Electronic Article Surveillance support with password-protected SET EAS (A2h) and RESET EAS commands - allows seamless integration into retail loss-prevention infrastructure. |
Applications
| Industrial Laundry Tracking | Asset Management |
|---|---|
|
Use Scenario: Reusable textile items (uniforms, linens) pass through automated washroom gates and sorting stations. IC Role / Device Role / Timing Role: SL2S5102FUD,003 serves as tamper-resistant identity anchor embedded in durable fabric tags; responds to 13.56 MHz gate readers at ≤1.5 m range during conveyor movement. Use Value: Enables batch-level inventory reconciliation, usage cycle counting, and maintenance scheduling without manual scanning - reducing labor cost by >40% in Tier-1 laundries. |
Use Scenario: High-value tools, medical equipment, or IT assets move across departments or facilities with periodic check-in/out. IC Role / Device Role / Timing Role: SL2S5102FUD,003 provides cryptographically secured UID and AFI-tagged identification in ruggedized epoxy-encapsulated tags; withstands repeated thermal cycling and chemical exposure. Use Value: Eliminates barcode degradation issues; supports simultaneous multi-reader interrogation in dense asset pools; reduces misplacement incidents by 72% in hospital pilot deployments. |
| Library Media Circulation | Factory Automation WIP Tracking |
|
Use Scenario: Books, DVDs, and library cards undergo self-checkout, return, and shelf-read operations using desktop and overhead readers. IC Role / Device Role / Timing Role: SL2S5102FUD,003 operates in Privacy Mode (enabled via BAh) during patron handling - suppressing UID broadcast until authenticated staff access. Use Value: Complies with patron privacy regulations (e.g., GDPR Article 21); prevents unauthorized tracking while retaining full functionality for authorized circulation workflows. |
Use Scenario: PCB assemblies and chassis move through SMT, test, burn-in, and packaging lines with real-time location updates. IC Role / Device Role / Timing Role: SL2S5102FUD,003 is integrated into metal-mount tags affixed to carriers; leverages 53 kbit/s FAST INVENTORY PAGE READ (B1h) for sub-second multi-unit identification at line junctions. Use Value: Reduces WIP data latency from minutes to <200 ms; enables dynamic routing logic based on real-time process status; cuts traceability audit time by 65%. |
Equivalent & Alternatives
The following parts are listed as comparable options for similar RFID tag IC applications.
| Alternative Part | Technical Difference | Application Difference | Selection Advice |
|---|---|---|---|
| SL2S5002FUD | Same die family but Ci = 23.5 pF (vs. 97 pF for SL2S5102FUD); smaller die size (520 × 484 µm vs. 520 × 607 µm); identical command set and memory map. | Better suited for compact antenna designs requiring lower capacitive loading; limited to shorter-range (<0.8 m) implementations where space constraints dominate. | Select SL2S5002FUD when optimizing for minimal tag footprint and moderate read distance; SL2S5102FUD preferred for maximum gate-width coverage. |
| SL2S5102FTB | Identical IC functionality but packaged in XSON3 (SOT1122) with LA/LB/n.c. terminals; no TEST/GND pads; 1 × 1.45 × 0.5 mm body; Ci = 97 pF. | Designed for surface-mount assembly on PCB-based tags; eliminates wafer handling complexity but sacrifices flexibility in flexible substrate integration. | Choose SL2S5102FTB for standardized SMT production; retain SL2S5102FUD for custom antenna embedding on PET, paper, or textile substrates. |
Compared with SL2S5002FUD and SL2S5102FTB, the SL2S5102FUD,003 offers optimal balance of extended 1.5 m read range (via higher Ci), wafer-level customization for diverse antenna form factors, and full access to TEST/GND for production validation - making it the preferred choice for high-reliability industrial label applications demanding both range and integration flexibility.
Availability
SL2S5102FUD,003 is available at Aetrix Electronics and suitable for industrial laundry tracking, asset management, library media circulation, and factory automation WIP tracking requiring stable component supply, long-term lifecycle support, and wafer-level sourcing consistency.
Supply support for SL2S5102FUD,003 includes scheduled delivery planning, volume procurement assistance, BOM continuity management, traceable sourcing, and lifecycle availability coordination for OEM customers, industrial embedded developers, connected-device designers, and electronics production programs.
Manufacturer
NXP Semiconductors is a global semiconductor leader specializing in secure connectivity solutions, with core expertise in RFID, NFC, automotive MCUs, and edge processing technologies.
The SL2S5102FUD,003 belongs to the ICODE SLIX-L product line - engineered specifically for privacy-aware, long-range smart label applications in industrial, logistics, and institutional environments where reliability, security, and ISO compliance are non-negotiable.
FAQ
What is the primary function of the SL2S5102FUD,003 in an RFID system?
The SL2S5102FUD,003 functions as a contactless, battery-free RFID tag IC compliant with ISO/IEC 15693 and ISO/IEC 18000-3 standards. It stores and transmits identity and user data via inductive coupling at 13.56 MHz, supporting up to 1.5 m read range, anticollision, and password-protected privacy and destroy features - all implemented within its 512-bit EEPROM and analog/digital RF architecture.
How does the SL2S5102FUD,003 differ from the SL2S5002FUD variant?
The SL2S5102FUD,003 differs from SL2S5002FUD primarily in its internal capacitance (Ci = 97 pF vs. 23.5 pF) and die dimensions (520 × 607 µm vs. 520 × 484 µm), enabling longer read range and greater antenna design flexibility. Both share identical command sets, memory organization, and security features - but SL2S5102FUD,003 is optimized for gate-width applications requiring maximum operational distance.
Can the SL2S5102FUD,003 be used in metal-rich environments?
Yes - the SL2S5102FUD,003 can be deployed in metal-rich environments when integrated into purpose-designed metal-mount tags using ferrite shielding or impedance-matching antenna layouts. Its 13.56 MHz frequency and robust analog front-end tolerate moderate electromagnetic interference, and its 97 pF Ci value aids tuning stability on conductive substrates, unlike lower-Ci variants.
What happens when the DESTROY SLIX-L command is executed on the SL2S5102FUD,003?
When the DESTROY SLIX-L command (B9h) is successfully executed with the correct 32-bit Destroy password, the SL2S5102FUD,003 enters a permanent non-responsive state. It ceases all RF communication - no UID, inventory response, or command acknowledgment - and cannot be revived by power cycling, field exposure, or any other means. This irreversible action is confirmed by absence of response to subsequent INVENTORY commands.
Is the TEST pad on the SL2S5102FUD,003 required for normal operation?
No - the TEST pad on the SL2S5102FUD,003 is exclusively for wafer-level functional verification during manufacturing and is not required for end-product operation. In final tag assembly, the TEST pad may be left unconnected, grounded, or omitted entirely depending on the bonding method; its presence does not affect SL2S5102FUD,003 runtime behavior or RF performance.
SL2S5102FUD,003 Specifications
- Product attributes
- Attribute value
- Manufacturer:
- NXP Semiconductors
- Series:
- I-Code
- Package/Case:
- Die
- Packaging:
- Bulk
- Product Status:
- Obsolete
- Type:
- RFID Transponder
- Frequency:
- 13.56MHz
- Standards:
- ISO 15693, ISO 18000-3
- Interface:
- -
- Voltage - Supply:
- 1.5V ~ 1.7V
- Operating Temperature:
- -40°C ~ 85°C
- Grade:
- -
- Qualification:
- -
- Mounting Type:
- Surface Mount
- Supplier Device Package:
- Die
SL2S5102FUD,003 FAQ
1.How can I place an order for SL2S5102FUD,003 through Aetrix?
Please submit a Request for Quotation (RFQ) for SL2S5102FUD,003 on Aetrix. Our sales agent will provide a competitive quotation and guide you through the order confirmation once you accept the terms.
2.Are the price and stock information for SL2S5102FUD,003 reliable?
The price and inventory of SL2S5102FUD,003 are updated periodically and may fluctuate due to market conditions. Stock and pricing data are typically refreshed every 24 hours. Quotation validity for SL2S5102FUD,003 is usually 5 days.
3.What payment methods are accepted for SL2S5102FUD,003?
We accept Wire Transfer, PayPal, Credit Card, Western Union, MoneyGram, and Escrow for SL2S5102FUD,003 transactions.
Note: Certain payment methods may incur a processing fee.
4.How is shipping managed for SL2S5102FUD,003?
SL2S5102FUD,003 orders can be shipped via leading logistics carriers, including DHL, UPS, FedEx, TNT, or Registered Mail.
Once your SL2S5102FUD,003 order is processed, you will receive an email with the shipment details and tracking number.
Note: Tracking information may take up to 24 hours to appear. Express delivery typically takes 3–5 business days.
5.How can I obtain technical support or documentation for SL2S5102FUD,003?
For technical support, including SL2S5102FUD,003 datasheets, pinout diagrams, or application guidance, please contact our engineering support team. They can provide detailed documentation and assistance for your SL2S5102FUD,003 requirements.
6.How does Aetrix verify that SL2S5102FUD,003 is sourced from the original manufacturer or authorized distributors?
All SL2S5102FUD,003 products on Aetrix are procured from qualified distributors and authorized channels. Our dedicated quality assurance team conducts strict verification, including traceability checks and, if necessary, third-party testing. This ensures that SL2S5102FUD,003 meets industry standards.
7.What is the process for return or replacement of SL2S5102FUD,003?
All SL2S5102FUD,003 units undergo pre-shipment inspection (PSI). If there is an issue with SL2S5102FUD,003, returns or replacements are accepted under the following conditions:
1.Quantity discrepancies, incorrect items, or visible external defects (such as breakage or corrosion), acknowledged by Aetrix.
2.The issue is reported within 90 days of delivery.
3.The SL2S5102FUD,003 part is unused and in its original packaging.
Return procedure for SL2S5102FUD,003:
1.Submit a request within 90 days.
2.Obtain a Return Material Authorization (RMA) from Aetrix.
SL2S5102FUD,003 Tags

-
SL2S2602FTBX
NXP Semiconductors

-
ST25DV04K-IER6S3
STMicroelectronics

-
ST25DV04K-IER6C3
STMicroelectronics

-
LXMSJZNCMD-217
Murata Electronics

-
NT3H2111W0FTTJ
NXP Semiconductors

-
NT3H2111W0FHKH
NXP Semiconductors

-
M24LR04E-RMC6T/2
STMicroelectronics

-
ST25DV04KC-JF6D3
STMicroelectronics

-
ST25DV64KC-IE6S3
STMicroelectronics
-
ST25DV64K-IER6T3
STMicroelectronics

-
NT3H2211W0FTTJ
NXP Semiconductors

-
NT3H2211W0FHKH
NXP Semiconductors
Tech Hub
A practical engineering guide to 3.3V and 5V logic compatibility, input thresholds, resistor dividers, translator ICs, MOSFET level shifting, I2C pull-ups, timing limits and power-sequencing risks.
The 74HC595 uses push-pull logic outputs, while the TPIC6B595 uses 50 V open-drain DMOS sinks for higher-power loads. This guide compares timing, current limits, 3.3 V interfacing, load wiring, thermal…
The 74HC595 converts serial data into eight stable parallel outputs. This guide covers pin functions, shift and storage timing, OE and MR behavior, drive-current limits, cascading, voltage compatibilit…
A technical comparison of level-sensitive latches and edge-triggered flip-flops, covering timing windows, setup and hold limits, master–slave operation, time borrowing, race-through, HDL inference and…
A D latch stores one bit while Enable controls when data can pass. This reference covers gate-level operation, truth tables, transparency, setup and hold timing, LE versus OE, common ICs and practical …
An SR latch stores one bit through cross-coupled feedback. This engineering reference covers NOR and NAND implementations, truth tables, forbidden-state recovery, gated operation, switch debouncing, fa…
Latch circuits retain one bit through feedback. This technical reference covers SR and D latches, truth tables, transparency, timing limits, latch-versus-flip-flop behavior, applications and common log…
An engineering guide to LED driver operation, constant-current and constant-voltage outputs, linear and switching topologies, dimming, IC selection, calculations, replacement compatibility, and fault c…
Operational amplifier guide covering op amp basics, feedback, ideal vs real op amps, common configurations, buffer circuits, offset, bias current, gain-bandwidth, slew rate, rail-to-rail limits and sel…
Jumper cables guide covering safe connection order, red and black clamp placement, final ground connection, cable gauge, length, clamp quality, copper vs CCA cables, jump starter comparison and battery…
